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Memory Test Socket
Provides optimized solution for all memory device/PKG and different test environments, from the smallest pitch ~ normal pitch (0.2P~1.0P).
Specifications Package TypeBGA, LGA, POP etc.
Available Pitch0.2P~
CharacteristicsLong life span.
Low Cres, Low Contact force (Multi-PARA)
High Speed, Low Powder, High Voltage Test Solution
No Ball Damage
Available For ESD