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Memory Test Socket
提供满足极小 pitch ~ normal pitch (0.2~1.0P)的所有 memory device/PKG及各种Test 环境的最优化 solution。
Specifications Package TypeBGA, LGA, POP etc.
Available Pitch0.2P~
CharacteristicsLong life span.
Low Cres, Low Contact force (Multi-PARA)
High Speed, Low Powder, High Voltage Test Solution
No Ball Damage
Available For ESD